Light absorption enhancement in Ge nanomembrane and its optoelectronic application
Author(s) -
Munho Kim,
Shih-Chia Liu,
Tong June Kim,
Jaeseong Lee,
JungHun Seo,
Weidong Zhou,
Zhenqiang Ma
Publication year - 2016
Publication title -
optics express
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.394
H-Index - 271
ISSN - 1094-4087
DOI - 10.1364/oe.24.016894
Subject(s) - materials science , attenuation coefficient , absorption (acoustics) , optoelectronics , optics , wavelength , germanium , photodetector , semiconductor , visible spectrum , silicon , physics , composite material
In this study, the light absorption property of Ge nanomembrane (Ge NM), which incorporates hydrogen (H), in near-infrared (NIR) wavelength range was analyzed. Due to the presence of a large amount of structural defects, the light absorption coefficient of the Ge layer becomes much higher (10 times) than that of bulk Ge in the wavelength range of 1000 ~1600 nm. Increased light absorption was further measured from released Ge NM that has H incorporation in comparison to that of bulk Ge, proving the enhanced light absorption coefficient of H incorporated Ge. Finally, metal-semiconductor-metal (MSM) photodetectors were demonstrated using the H incorporated Ge on GeOI.
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