Integration of nanostructured planar diffractive lenses dedicated to near infrared detection for CMOS image sensors
Author(s) -
Thomas Lopez,
Sébastien Massenot,
Magali Estribeau,
Pierre Magnan,
Fabrice Pardo,
Jean-Luc Pélouard
Publication year - 2016
Publication title -
optics express
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.394
H-Index - 271
ISSN - 1094-4087
DOI - 10.1364/oe.24.008809
Subject(s) - optics , materials science , lens (geology) , planar , optoelectronics , plasmon , cmos , image sensor , pixel , dielectric , monochromatic color , dot pitch , physics , computer science , computer graphics (images)
This paper deals with the integration of metallic and dielectric nanostructured planar lenses into a pixel from a silicon based CMOS image sensor, for a monochromatic application at 1.064 μm. The first is a Plasmonic Lens, based on the phase delay through nanoslits, which has been found to be hardly compatible with current CMOS technology and exhibits a notable metallic absorption. The second is a dielectric Phase-Fresnel Lens integrated at the top of a pixel, it exhibits an Optical Efficiency (OE) improved by a few percent and an angle of view of 50°. The third one is a metallic diffractive lens integrated inside a pixel, which shows a better OE and an angle of view of 24°. The last two lenses exhibit a compatibility with a spectral band close to 1.064 μm.
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