Exploiting the image of the surface reflectivity to measure refractive index profiling for various optical fibers
Author(s) -
Chun-Jen Weng,
Ken-Yuh Hsu,
Y. F. Chen
Publication year - 2015
Publication title -
optics express
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.394
H-Index - 271
ISSN - 1094-4087
DOI - 10.1364/oe.23.011755
Subject(s) - optics , materials science , refractive index , optical fiber , graded index fiber , halogen lamp , multi mode optical fiber , normalized frequency (unit) , pixel , wavelength , fiber optic sensor , optoelectronics , physics , phase locked loop , frequency synthesizer , phase noise
A direct image method of surface reflectivities on a cleaved fiber end with a filtered halogen lamp and a TE-cooled CCD with high dynamic range is proposed to measure the multi-wavelength refractive index profiling (RIP). A polished black glass is used to be a reference standard for measuring the absolute reflectivity of the fiber end. With the developed calibration procedures, both the spatially dependent sensitivity and spectral responsivity of the CCD pixels can be eliminated to achieve the high spatial accuracy. Tested fiber is connected with a fiber terminator to prevent errors from the backside return light. With the present method, the RIP can be precisely measured for not only multi-mode fibers but also single-mode fibers.
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