Measurement of the modulation transfer function of an X-ray microscope based on multiple Fourier orders analysis of a Siemens star | Zendy

Joaquı́n Otón | Zendy; Carlos Óscar S. Sorzano | Zendy; R. Marabini | Zendy; Eva Pereiro | Zendy; J.M. Carazo | Zendy

Open Access

Measurement of the modulation transfer function of an X-ray microscope based on multiple Fourier orders analysis of a Siemens star

Author(s) -

Joaquı́n Otón,

Carlos Óscar S. Sorzano,

R. Marabini,

Eva Pereiro,

J.M. Carazo

Publication year - 2015

Publication title -

optics express

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 1.394

H-Index - 271

ISSN - 1094-4087

DOI - 10.1364/oe.23.009567

Subject(s) - optical transfer function , optics , microscope , fourier transform , transfer function , spatial frequency , point spread function , fourier analysis , fourier optics , physics , image quality , image resolution , computer science , artificial intelligence , image (mathematics) , electrical engineering , quantum mechanics , engineering

Soft X-ray tomography (SXT) is becoming a powerful imaging technique to analyze eukaryotic whole cells close to their native state. Central to the analysis of the quality of SXT 3D reconstruction is the estimation of the spatial resolution and Depth of Field of the X-ray microscope. In turn, the characterization of the Modulation Transfer Function (MTF) of the optical system is key to calculate both parameters. Consequently, in this work we introduce a fully automated technique to accurately estimate the transfer function of such an optical system. Our proposal is based on the preprocessing of the experimental images to obtain an estimate of the input pattern, followed by the analysis in Fourier space of multiple orders of a Siemens Star test sample, extending in this way its measured frequency range.

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