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Modeling the specular spectral reflectance of partially ordered alumina nanopores on an aluminum substrate
Author(s) -
Dengfeng Kuang,
Renée Charrière,
Natalia Matsapey,
Manuel Flury,
Jenny Faucheu,
Pierre Chavel
Publication year - 2015
Publication title -
optics express
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.394
H-Index - 271
ISSN - 1094-4087
DOI - 10.1364/oe.23.004506
Subject(s) - nanopore , specular reflection , materials science , nanoporous , optics , bidirectional reflectance distribution function , perpendicular , substrate (aquarium) , anodizing , aluminium , refractive index , porosity , reflectivity , radius , optoelectronics , nanotechnology , geometry , composite material , physics , oceanography , mathematics , geology , computer security , computer science
Anodizing of aluminum generates a porous alumina layer comprising cylindrical nanopores (300 nm diameter) extending essentially perpendicular to the substrate. The pore distribution over the surface exhibits a short-distance order close to hexagonal arrangement. On the contrary, long-distance order cannot be defined: the arrangement is not periodic. Visual observation of such nanoporous layers shows a reddish specular reflectance consistent with reflectance spectrum measurements. This work is a parametric study aiming at demonstrating that color effects are caused by the presence of disorder illustrated by the deviations from periodicity in terms of nanopore location and nanopore radius. Using the method of Rigorous Coupled Wave Analysis (RCWA), the reflectance spectrum has been simulated. Although our calculations were done using a simple one-dimensional (1D) model, a fair fit with experimental results is found.

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