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A one-shot-projection method for measurement of specular surfaces
Author(s) -
Zhenzhou Wang
Publication year - 2015
Publication title -
optics express
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.394
H-Index - 271
ISSN - 1094-4087
DOI - 10.1364/oe.23.001912
Subject(s) - specular reflection , specular highlight , optics , projection (relational algebra) , shot (pellet) , measure (data warehouse) , reflection (computer programming) , ray , computer science , physics , materials science , algorithm , database , metallurgy , programming language
In this paper, a method is proposed to measure the shapes of specular surfaces with one-shot-projection of structured laser patterns. By intercepting the reflection of the reflected laser pattern twice with two diffusive planes, the closed form solution is achieved for each reflected ray. The points on the specular surface are reconstructed by computing the intersections of the incident rays and the reflected rays. The proposed method can measure both static and dynamic specular shapes due to its one-shot-projection, which is beyond the capability of most of state of art methods that need multiple projections. To our knowledge, the proposed method is the only method so far that could yield the closed form solutions for the dynamic and specular surfaces.

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