Machine-learning approach to holographic particle characterization
Author(s) -
Aaron Yevick,
Mark Hannel,
David G. Grier
Publication year - 2014
Publication title -
optics express
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.394
H-Index - 271
ISSN - 1094-4087
DOI - 10.1364/oe.22.026884
Subject(s) - holography , characterization (materials science) , computer science , support vector machine , tracking (education) , particle (ecology) , process (computing) , optics , optical tweezers , artificial intelligence , physics , psychology , pedagogy , oceanography , geology , operating system
Holograms of colloidal dispersions encode comprehensive information about individual particles' three-dimensional positions, sizes and optical properties. Extracting that information typically is computationally intensive, and thus slow. Here, we demonstrate that machine-learning techniques based on support vector machines (SVMs) can analyze holographic video microscopy data in real time on low-power computers. The resulting stream of precise particle-resolved tracking and characterization data provides unparalleled insights into the composition and dynamics of colloidal dispersions and enables applications ranging from basic research to process control and quality assurance.
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