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Enhancing one dimensional sensitivity with plasmonic coupling
Author(s) -
Samuel O’Mullane,
Brennan Peterson,
Joseph Race,
Nick Keller,
Alain C. Diebold
Publication year - 2014
Publication title -
optics express
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.394
H-Index - 271
ISSN - 1094-4087
DOI - 10.1364/oe.22.026246
Subject(s) - optics , grating , plasmon , refractive index , materials science , diffraction grating , rigorous coupled wave analysis , angstrom , sensitivity (control systems) , surface plasmon , resolution (logic) , coupling (piping) , physics , chemistry , engineering , electronic engineering , artificial intelligence , computer science , metallurgy , crystallography
In this paper, we propose a cross-grating structure to enhance the critical dimension sensitivity of one dimensional nanometer scale metal gratings. Making use of the interaction between slight changes in refractive index and localized plasmons, we demonstrate sub-angstrom scale sensitivity in this structure. Compared to unaltered infinite metal gratings and truncated finite gratings, this cross-grating structure shows robust spectra dependent mostly on the dimension of the smaller line width and pitch. While typical scatterometry simulations show angstrom resolution at best, this structure has demonstrated picometer resolution. Due to the wide range of acceptable specifications, we expect experimental confirmation of such structures to soon follow.

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