Formation of super-resolution spot through nonlinear Fabry–Perot cavity structures: theory and simulation
Author(s) -
Jingsong Wei,
Rui Wang,
Hui Yan,
Yongtao Fan
Publication year - 2014
Publication title -
optics express
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.394
H-Index - 271
ISSN - 1094-4087
DOI - 10.1364/oe.22.007883
Subject(s) - optics , materials science , fabry–pérot interferometer , thin film , hot spot (computer programming) , interference (communication) , nonlinear system , laser , nanolithography , diffraction , interferometry , optoelectronics , physics , nanotechnology , fabrication , telecommunications , computer science , medicine , channel (broadcasting) , alternative medicine , pathology , quantum mechanics , operating system
This study explores how interference manipulation breaks through the diffraction limit and induces super-resolution nano-optical hot spots through the nonlinear Fabry-Perot cavity structure. The theoretical analytical model is established, and the numerical simulation results show that when the thickness of the nonlinear thin film inside the nonlinear Fabry-Perot cavity structure is adjusted to centain value, the constructive interference effect can be formed in the central point of the spot, which causes the nanoscale optical hot spot in the central region to be produced. The simulation results also tell us that the hot spot size is sensitive to nonlinear thin film thickness, and the accuracy is required to be up to nanometer or even subnanometer scale, which is very large challenging for thin film deposition technique, however, slightly changing the incident laser power can compensate for drawbacks of low thickness accuracy of nonlinear thin films. Taking As(2)S(3) as the nonlinear thin film, the central hot spot with a size of 40nm is obtained at suitable nonlinear thin film thickness and incident laser power. The central hot spot size is only about λ/16, which is very useful in super-high density optical recording, nanolithography, and high-resolving optical surface imaging.
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