Quality control of oblique incidence optical coatings based on normal incidence measurement data | Zendy

Tatiana V. Amotchkina | Zendy; Michael K. Trubetskov | Zendy; Alexander V. Tikhonravov | Zendy; S. Schlichting | Zendy; Henrik Ehlers | Zendy; Detlev Ristau | Zendy; David L. Death | Zendy; Robert J. Francis | Zendy; Vladimir Pervak | Zendy

AI Assistant Blog Pricing

Home ZAIA Blog

Open Access

Quality control of oblique incidence optical coatings based on normal incidence measurement data

Author(s) -

Tatiana V. Amotchkina,

Michael K. Trubetskov,

Alexander V. Tikhonravov,

S. Schlichting,

Henrik Ehlers,

Detlev Ristau,

David L. Death,

Robert J. Francis,

Vladimir Pervak

Publication year - 2013

Publication title -

optics express

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 1.394

H-Index - 271

ISSN - 1094-4087

DOI - 10.1364/oe.21.021508

Subject(s) - oblique case , optics , incidence (geometry) , beam splitter , materials science , laser , physics , philosophy , linguistics

We demonstrate selection of reliable approaches for post-production characterization of oblique incidence multilayer optical coatings. The approaches include choice of input information, selection of adequate coating model, corresponding numerical characterization algorithm, and verification of the results. Applications of the approaches are illustrated with post-production characterization of oblique incidence edge filter, oblique incidence beam splitter and oblique incidence 43-layer quarter-wave mirror.

The content you want is available to Zendy users.

Already have an account? Click here to sign in.

Having issues? You can contact us here

Accelerating Research