On the resolution and linearity of lensless in situ X-ray beam diagnostics using pixelated sensors | Zendy

Anton Kachatkou | Zendy; Roelof van Silfhout | Zendy

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On the resolution and linearity of lensless in situ X-ray beam diagnostics using pixelated sensors

Author(s) -

Anton Kachatkou,

Roelof van Silfhout

Publication year - 2013

Publication title -

optics express

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 1.394

H-Index - 271

ISSN - 1094-4087

DOI - 10.1364/oe.21.004291

Subject(s) - optics , beam (structure) , pinhole (optics) , resolution (logic) , image resolution , pinhole camera , linearity , physics , aperture (computer memory) , materials science , collimated light , pixel , laser , computer science , quantum mechanics , artificial intelligence , acoustics

We present a theoretical model that describes the resolution and linearity of a novel transparent X-ray beam imaging and position measurement method. Using a pinhole or coded aperture camera with pixelated area sensors to image a small fraction of radiation scattered by a thin foil placed at oblique angles with respect to the beam, a very precise measurement of the beam position is made. We show that the resolution of the method is determined by incident beam intensity, beam size, camera parameters, sensor pixel size and noise. The model is verified experimentally showing a sub-micrometer resolution over a large linear range.

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