Grain size dependence of surface plasmon enhanced photoluminescence | Zendy

Xiaoying Xu | Zendy; Mitsuru Funato | Zendy; Yoichi Kawakami | Zendy; Koichi Okamoto | Zendy; Kaoru Tamada | Zendy

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Grain size dependence of surface plasmon enhanced photoluminescence

Author(s) -

Xiaoying Xu,

Mitsuru Funato,

Yoichi Kawakami,

Koichi Okamoto,

Kaoru Tamada

Publication year - 2013

Publication title -

optics express

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 1.394

H-Index - 271

ISSN - 1094-4087

DOI - 10.1364/oe.21.003145

Subject(s) - materials science , photoluminescence , surface plasmon , grain size , wavelength , optics , optoelectronics , plasmon , quantum efficiency , localized surface plasmon , light emitting diode , lattice constant , physics , diffraction , metallurgy

Photoluminescence (PL) in the InGaN quantum well based light-emitting diodes (LED) is greatly mediated through the coupling with the Surface Plasmons (SPs) at the interface of the sputtered Ag film. SPs coupled PL is independently tuned through controlling the grain size of the sputtered Ag films. The grain size of ~50 nm exhibits the maximum light extraction efficiency (LEE) at the wavelength of 460 nm. This grain size agrees with the periodic lattice constant of the grating structure in the calculation, where the momentum mismatch between the SPs and the radiative light can be compensated.

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