Pencil beam coded aperture x-ray scatter imaging
Author(s) -
Kenneth P. MacCabe,
Kalyani Krishnamurthy,
Amarpreet S. Chawla,
Daniel L. Marks,
Ehsan Samei,
David J. Brady
Publication year - 2012
Publication title -
optics express
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.394
H-Index - 271
ISSN - 1094-4087
DOI - 10.1364/oe.20.016310
Subject(s) - optics , pencil (optics) , coded aperture , aperture (computer memory) , ptychography , beam (structure) , physics , materials science , diffraction , detector , acoustics
We use coded aperture x-ray scatter imaging to interrogate scattering targets with a pencil beam. Observations from a single x-ray exposure of a flat-panel scintillation detector are used to simultaneously determine the along-beam positions and momentum transfer profiles of two crystalline powders (NaCl and Al). The system operates with a 3 cm range resolution and a momentum transfer resolution of 0.1 nm−1. These results demonstrate that a single snapshot can be used to estimate scattering properties along an x-ray beam, and serve as a foundation for volumetric imaging of scattering objects.
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