Complete polarization and phase control for focus-shaping in high-NA microscopy
Author(s) -
Fiona Kenny,
David Lara,
Oscar G. Rodríguez-Herrera,
Chris Dainty
Publication year - 2012
Publication title -
optics express
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.394
H-Index - 271
ISSN - 1094-4087
DOI - 10.1364/oe.20.014015
Subject(s) - optics , polarization (electrochemistry) , radial polarization , retarder , spatial light modulator , light beam , diffraction , physics , beam (structure) , materials science , microscopy , spatial frequency , phase control , phase (matter) , laser beam quality , laser beams , laser , chemistry , quantum mechanics , composite material
We show that, in order to attain complete polarization control across a beam, two spatially resolved variable retardations need to be introduced to the light beam. The orientation of the fast axes of the retarders must be linearly independent on the Poincaré sphere if a fixed starting polarization state is used, and one of the retardations requires a range of 2π. We also present an experimental system capable of implementing this concept using two passes on spatial light modulators (SLMs). A third SLM pass can be added to control the absolute phase of the beam. Control of the spatial polarization and phase distribution of a beam has applications in high-NA microscopy, where these properties can be used to shape the focal field in three dimensions. We present some examples of such fields, both theoretically calculated using McCutchen's method and experimentally observed.
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