Open AccessDirect measurement of the near-field super resolved focused spot in InSb
Author(s) -
Alberto C. Assafrao,
Arthur J. H. Wachters,
Marcel A. Verheijen,
A. M. Nugrowati,
Silvania F. Pereira,
H. P. Urbach,
M. Armand,
S. Olivier
Publication year - 2012
Publication title -
optics express
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.394
H-Index - 271
ISSN - 1094-4087
DOI - 10.1364/oe.20.010426
Subject(s) - optics , diffraction , near and far field , materials science , laser , resolution (logic) , wavelength , microscopy , image resolution , microscope , near field scanning optical microscope , 3d optical data storage , optical storage , optical microscope , physics , scanning electron microscope , artificial intelligence , computer science
Under appropriate laser exposure, a thin film of InSb exhibits a sub-wavelength thermally modified area that can be used to focus light beyond the diffraction limit. This technique, called Super-Resolution Near-Field Structure, is a potential candidate for ultrahigh density optical data storage and many other high-resolution applications. We combined near field microscopy, confocal microscopy and time resolved pump-probe technique to directly measure the induced sub-diffraction limited spot in the near-field regime. The measured spot size was found to be dependent on the laser power and a decrease of 25% (100 nm) was observed. Experimental evidences that support a threshold-like simulation model to describe the effect are also provided. The experimental data are in excellent agreement with rigorous simulations obtained with a three dimensional Finite Element Method code.
Accelerating Research
Robert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom
Address
John Eccles HouseRobert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom