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Mode profile imaging and loss measurement for uniform and tapered single-mode 3D waveguides in diffusive photopolymer
Author(s) -
Chunfang Ye,
Keith T. Kamysiak,
Amy C. Sullivan,
Robert R. McLeod
Publication year - 2012
Publication title -
optics express
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.394
H-Index - 271
ISSN - 1094-4087
DOI - 10.1364/oe.20.006575
Subject(s) - optics , materials science , polishing , single mode optical fiber , modal , lithography , photomask , optoelectronics , laser , resist , physics , layer (electronics) , polymer chemistry , composite material
We demonstrate single-mode uniform and parabolically tapered three-dimensional waveguides fabricated via direct-write lithography in diffusion-based photopolymers. Modulation of the writing power is shown to compensate Beer-Lambert absorption in the single-photon initiator and to provide precise control of modal tapers. A laminated sample preparation is introduced to enable full 3D characterization of these modal tapers without the need for sample polishing which is difficult for this class of polymer. The accuracy and repeatability of this modal characterization is shown to allow precise measurement of propagation loss from single samples. These testing procedures are used to demonstrate single-mode waveguides with 0.147 dB/cm excess propagation loss and symmetrical tapers up to 1:2.5 using 1.5 microwatts of continuous write power.

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