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Color effects from scattering on random surface structures in dielectrics
Author(s) -
Jeppe Sandvik Clausen,
Alexander Bruun Christiansen,
Joergen Garnaes,
N. Asger Mortensen,
Anders Kristensen
Publication year - 2012
Publication title -
optics express
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.394
H-Index - 271
ISSN - 1094-4087
DOI - 10.1364/oe.20.004376
Subject(s) - optics , specular reflection , scattering , materials science , dielectric , transmittance , diffraction , light scattering , iridescence , paraxial approximation , surface (topology) , optoelectronics , physics , geometry , beam (structure) , mathematics
We show that cheap large area color filters, based on surface scattering, can be fabricated in dielectric materials by replication of random structures in silicon. The specular transmittance of three different types of structures, corresponding to three different colors, have been characterized. The angle resolved scattering has been measured and compared to predictions based on the measured surface topography and by the use of non-paraxial scalar diffraction theory. From this it is shown that the color of the transmitted light can be predicted from the topography of the randomly textured surfaces.

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