z-logo
open-access-imgOpen Access
Planar waveguides with less than 01 dB/m propagation loss fabricated with wafer bonding
Author(s) -
Jared F. Bauters,
Martijn J. R. Heck,
Demis D. John,
Jonathon S. Barton,
C.M. Bruinink,
Arne Leinse,
René Heideman,
Daniel J. Blumenthal,
John E. Bowers
Publication year - 2011
Publication title -
optics express
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.394
H-Index - 271
ISSN - 1094-4087
DOI - 10.1364/oe.19.024090
Subject(s) - reflectometry , optics , materials science , planar , wafer , refractive index , waveguide , coupling loss , insertion loss , wavelength , radius , wafer bonding , optoelectronics , optical fiber , time domain , physics , computer graphics (images) , computer security , computer science , computer vision
We demonstrate a wafer-bonded silica-on-silicon planar waveguide platform with record low total propagation loss of (0.045 ± 0.04) dB/m near the free space wavelength of 1580 nm. Using coherent optical frequency domain reflectometry, we characterize the group index, fiber-to-chip coupling loss, critical bend radius, and propagation loss of these waveguides.

The content you want is available to Zendy users.

Already have an account? Click here to sign in.
Having issues? You can contact us here
Accelerating Research

Address

John Eccles House
Robert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom