Two dimensional hard x-ray nanofocusing with crossed multilayer Laue lenses | Zendy

Hanfei Yan | Zendy; Volker Rose | Zendy; Deming Shu | Zendy; Enju Lima | Zendy; Hyon Chol Kang | Zendy; Ray Conley | Zendy; Chian Liu | Zendy; Nima Jahedi | Zendy; Albert T. Macrander | Zendy; G. B. Stephenson | Zendy; Martin V. Holt | Zendy; Yong S. Chu | Zendy; Ming Lu | Zendy; J. Mäser | Zendy

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Two dimensional hard x-ray nanofocusing with crossed multilayer Laue lenses

Author(s) -

Hanfei Yan,

Volker Rose,

Deming Shu,

Enju Lima,

Hyon Chol Kang,

Ray Conley,

Chian Liu,

Nima Jahedi,

Albert T. Macrander,

G. B. Stephenson,

Martin V. Holt,

Yong S. Chu,

Ming Lu,

J. Mäser

Publication year - 2011

Publication title -

optics express

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 1.394

H-Index - 271

ISSN - 1094-4087

DOI - 10.1364/oe.19.015069

Subject(s) - optics , full width at half maximum , x ray optics , resolution (logic) , nanometre , x ray , diffraction , physics , photon counting , photon energy , photon , materials science , optoelectronics , artificial intelligence , computer science

Hard x-ray microscopy with nanometer resolution will open frontiers in the study of materials and devices, environmental sciences, and life sciences by utilizing the unique characterization capabilities of x-rays. Here we report two-dimensional nanofocusing by multilayer Laue lenses (MLLs), a type of diffractive optics that is in principle capable of focusing x-rays to 1 nm. We demonstrate focusing to a 25 × 27 nm(2) FWHM spot with an efficiency of 2% at a photon energy of 12 keV, and to a 25 × 40 nm(2) FWHM spot with an efficiency of 17% at a photon energy of 19.5 keV.

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