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Phasing of coherent femtosecond X-ray diffraction from size-varying nanocrystals
Author(s) -
John C. H. Spence,
Richard A. Kirian,
Xiaoyu Wang,
Uwe Weierstall,
K. E. Schmidt,
Thomas A. White,
Anton Barty,
Henry N. Chapman,
Stefano Marchesini,
James M. Holton
Publication year - 2011
Publication title -
optics express
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.394
H-Index - 271
ISSN - 1094-4087
DOI - 10.1364/oe.19.002866
Subject(s) - femtosecond , optics , diffraction , bragg's law , nanocrystal , ptychography , materials science , laser , particle size , phase (matter) , scattering , physics , nanotechnology , chemistry , quantum mechanics
The scattering between Bragg reflections from nanocrystals is used to aid solution of the phase problem. We describe a method for reconstructing the charge density of a typical molecule within a single unit cell, if sufficiently finely-sampled "snap-shot" diffraction data (as provided a free-electron X-ray laser) are available from many nanocrystals of different sizes lying in random orientations. By using information on the particle-size distribution within the patterns, this digital method succeeds, using all the data, without knowledge of the distribution of particle size or requiring atomic-resolution data.

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