Sub-15 nm beam confinement by two crossed x-ray waveguides
Author(s) -
Sven Krüger,
Klaus Giewekemeyer,
Sebastian Kalbfleisch,
M. Bartels,
H. Neubauer,
Tim Salditt
Publication year - 2010
Publication title -
optics express
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.394
H-Index - 271
ISSN - 1094-4087
DOI - 10.1364/oe.18.013492
Subject(s) - optics , full width at half maximum , waveguide , planar , holography , diffraction , beam (structure) , electron beam lithography , physics , phase (matter) , amplitude , materials science , computer graphics (images) , layer (electronics) , quantum mechanics , computer science , resist , composite material
We have combined two high transmission planar x-ray waveguides glued onto each other in a crossed geometry to form an effective quasi-point source. From measurements of the far-field diffraction pattern, the phase and amplitude of the near-field distribution is retrieved using the error-reduction algorithm. In agreement with finite difference field simulations (forward calculation), the reconstructed exit wave intensity distribution (inverse calculation) exhibits a full width at half maximum (FWHM) below 15 nm in both dimensions. Finally, holographic imaging is successfully demonstrated for the crossed waveguide device by translation of a lithographic test structure through the waveguide beam.
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