Electron beam excitation assisted optical microscope with ultra-high resolution | Zendy

Wataru Inami | Zendy; Kentaro Nakajima | Zendy; Atsuo Miyakawa | Zendy; Yoshimasa Kawata | Zendy

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Electron beam excitation assisted optical microscope with ultra-high resolution

Author(s) -

Wataru Inami,

Kentaro Nakajima,

Atsuo Miyakawa,

Yoshimasa Kawata

Publication year - 2010

Publication title -

optics express

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 1.394

H-Index - 271

ISSN - 1094-4087

DOI - 10.1364/oe.18.012897

Subject(s) - microscope , optics , materials science , microscopy , optical microscope , conventional transmission electron microscope , near field scanning optical microscope , environmental scanning electron microscope , electron microscope , refractive index , 4pi microscope , scanning electron microscope , optoelectronics , scanning transmission electron microscopy , physics

We propose electron beam excitation assisted optical microscope, and demonstrated its resolution higher than 50 nm. In the microscope, a light source in a few nanometers size is excited by focused electron beam in a luminescent film. The microscope makes it possible to observe dynamic behavior of living biological specimens in various surroundings, such as air or liquids. Scan speed of the nanometric light source is faster than that in conventional near-field scanning optical microscopes. The microscope enables to observe optical constants such as absorption, refractive index, polarization, and their dynamic behavior on a nanometric scale. The microscope opens new microscopy applications in nano-technology and nano-science.

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