Optical properties of red emitting self-assembled InP/(Al_020Ga_080)_051In_049P quantum dot based micropillars
Author(s) -
W.-M. Schulz,
Tim Thomay,
M. Eichfelder,
Moritz Bommer,
Michael Wiesner,
R. Roßbach,
Michael Jetter,
Rudolf Bratschitsch,
Alfred Leitenstorfer,
Peter Michler
Publication year - 2010
Publication title -
optics express
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.394
H-Index - 271
ISSN - 1094-4087
DOI - 10.1364/oe.18.012543
Subject(s) - quantum dot , materials science , photoluminescence , optoelectronics , planar , focused ion beam , purcell effect , optics , distributed bragg reflector , etching (microfabrication) , optical microcavity , spontaneous emission , laser , ion , nanotechnology , physics , wavelength , computer graphics (images) , layer (electronics) , quantum mechanics , computer science
Using focused ion beam etching techniques, micropillar cavities were fabricated from a high reflective AlAs/AlGaAs distributed Bragg reflector planar cavity containing self-assembled InP quantum dots in (Al(0.20)Ga(0.80))(0.51)In(0.49)P barrier layers. The mode spectra of pillars with different diameters were investigated using micro-photoluminescence, showing excellent agreement with theory. Quality factors of the pillar cavities up to 3650 were observed. Furthermore, for a microcavity pillar with 1.26 mum diameter, single-photon emission is demonstrated by performing photon correlation measurements under pulsed excitation.
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