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Properties of broadband depth-graded multilayer mirrors for EUV optical systems
Author(s) -
Andrey Yakshin,
I. V. Kozhevnikov,
E. Zoethout,
E. Louis,
F. Bijkerk
Publication year - 2010
Publication title -
optics express
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.394
H-Index - 271
ISSN - 1094-4087
DOI - 10.1364/oe.18.006957
Subject(s) - optics , materials science , extreme ultraviolet lithography , broadband , wavelength , surface finish , fabrication , optical coating , angle of incidence (optics) , range (aeronautics) , surface roughness , optoelectronics , thin film , physics , composite material , medicine , alternative medicine , pathology , nanotechnology
The optical properties of a-periodic, depth-graded multilayer mirrors operating at 13.5 nm wavelength are investigated using different compositions and designs to provide a constant reflectivity over an essentially wider angular range than periodic multilayers. A reflectivity of up to about 60% is achieved in these calculation in the [0, 18 degrees] range of the angle of incidence for the structures without roughness. The effects of different physical and technological factors (interfacial roughness, natural interlayers, number of bi-layers, minimum layer thickness, inaccuracy of optical constants, and thickness errors) are discussed. The results from an experiment on the fabrication of a depth-graded Mo/Si multilayer mirror with a wide angular bandpass in the [0, 16 degrees] range are presented and analyzed.

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