High accuracy polarization measurements using binary polarization rotators
Author(s) -
X. Steve Yao,
Xiaojun Chen,
Tiegen Liu
Publication year - 2010
Publication title -
optics express
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.394
H-Index - 271
ISSN - 1094-4087
DOI - 10.1364/oe.18.006667
Subject(s) - optics , polarization (electrochemistry) , binary number , polarization mode dispersion , polarization rotator , physics , brewster's angle , materials science , dispersion (optics) , birefringence , chemistry , arithmetic , mathematics , brewster
We report a novel system for the accurate measurement of all polarization related parameters, including polarization mode dispersion and polarization dependent loss, using binary magneto-optic polarization rotators. By taking advantage of the binary nature of the rotators, we achieved unprecedented DGD, SOPMD, and PDL accuracies of 2.6 fs, 1.39ps(2), and 0.06 dB respectively; repeatabilities of 0.022 fs, 0.28 ps(2), and 0.034dB respectively; and resolutions of 1 fs, 0.005 ps(2) and 0.01dB respectively, from 1480 to 1620 nm.
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