Two-photon excitation STED microscopy
Author(s) -
Gaël Moneron,
Stefan W. Hell
Publication year - 2009
Publication title -
optics express
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.394
H-Index - 271
ISSN - 1094-4087
DOI - 10.1364/oe.17.014567
Subject(s) - sted microscopy , optics , microscopy , diffraction , laser , fluorescence microscope , materials science , fluorescence , super resolution microscopy , excitation , two photon excitation microscopy , stimulated emission , resolution (logic) , optoelectronics , physics , quantum mechanics , artificial intelligence , computer science
We report sub-diffraction resolution in two-photon excitation (TPE) fluorescence microscopy achieved by merging this technique with stimulated-emission depletion (STED). We demonstrate an easy-to-implement and promising laser combination based on a short-pulse laser source for two-photon excitation and a continuous-wave (CW) laser source for resolution enhancement. Images of fluorescent nanoparticles and the immunostained transcription regulator NF kappaB in mammalian cell nuclei exhibit resolutions of <50 nm and approximately 70 nm in the focal plane, respectively, corresponding to a 4-5.4-fold improvement over the diffraction barrier.
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