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TeraHertz imaging of hidden paint layers on canvas
Author(s) -
A. J. L. Adam,
P. C. M. Planken,
Sabrina Meloni,
Joris Dik
Publication year - 2009
Publication title -
optics express
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.394
H-Index - 271
ISSN - 1094-4087
DOI - 10.1364/oe.17.003407
Subject(s) - terahertz radiation , optics , materials science , reflection (computer programming) , refractive index , metamaterial , monochrome , optoelectronics , computer science , physics , programming language
We show terahertz reflection images of hidden paint layers in a painting on canvas and compare the results with X-ray Radiography and In-frared Reflectography. Our terahertz measurements show strong reflections from both the canvas/paint interface and from the raw umber/lead white interface, indicating sufficient refractive-index contrast. Our results show that X-rays cannot be used to image through the lead white pigment which effectively blocks the X-rays. Although Infrared Reflectography is capable of vaguely observing the hidden paint strokes from the canvas side, we show that only terahertz imaging is capable of providing information on the thickness of the hidden paint layers. Terahertz imaging is thus shown to be a powerful imaging method for art historians, conservators and conservation scientists.

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