Numerical method for high accuracy index of refraction estimation for spectro-angular surface plasmon resonance systems | Zendy

Colin J. Alleyne | Zendy; Andrew G. Kirk | Zendy; Wei-Yin Chien | Zendy; Paul G. Charette | Zendy

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Numerical method for high accuracy index of refraction estimation for spectro-angular surface plasmon resonance systems

Author(s) -

Colin J. Alleyne,

Andrew G. Kirk,

Wei-Yin Chien,

Paul G. Charette

Publication year - 2008

Publication title -

optics express

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 1.394

H-Index - 271

ISSN - 1094-4087

DOI - 10.1364/oe.16.019493

Subject(s) - optics , refractive index , surface plasmon , surface plasmon resonance , angular resolution (graph drawing) , centroid , refraction , range (aeronautics) , resonance (particle physics) , dispersion (optics) , noise (video) , physics , materials science , plasmon , image (mathematics) , computer science , mathematics , artificial intelligence , quantum mechanics , combinatorics , particle physics , nanoparticle , composite material

An eigenvector analysis based algorithm is presented for estimating refractive index changes from 2-D reflectance/dispersion images obtained with spectro-angular surface plasmon resonance systems. High resolution over a large dynamic range can be achieved simultaneously. The method performs well in simulations with noisy data maintaining an error of less than 10(-8) refractive index units with up to six bits of noise on 16 bit quantized image data. Experimental measurements show that the method results in a much higher signal to noise ratio than the standard 1-D weighted centroid dip finding algorithm.

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