Fabrication of large-area patterned porous silicon distributed Bragg reflectors
Author(s) -
D. Mangaiyarkarasi,
Ow Yueh Sheng,
Mark B. H. Breese,
Vincent L. Fuh,
Eric T. Xioasong
Publication year - 2008
Publication title -
optics express
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.394
H-Index - 271
ISSN - 1094-4087
DOI - 10.1364/oe.16.012757
Subject(s) - materials science , optics , wafer , fabrication , silicon , porous silicon , micrometer , optoelectronics , bragg's law , lithography , distributed bragg reflector , physics , wavelength , diffraction , medicine , alternative medicine , pathology
A process to fabricate porous silicon Bragg reflectors patterned on a micrometer lateral scale over wafer areas of several square centimeters is described. This process is based on a new type of projection system involving a megavolt accelerator and a quadrupole lens system to project a uniform distribution of MeV ions over a wafer surface, which is coated with a multilevel mask. In conjunction with electrochemical anodisation, this enables the rapid production of high-density arrays of a variety of optical and photonic components in silicon such as waveguides and optical microcavities for applications in high-definition reflective displays and optical communications.
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