Broadband and omnidirectional antireflection employing disordered GaN nanopillars
Author(s) -
C. H. Chiu,
Peichen Yu,
HaoChung Kuo,
C. C. Chen,
TienChang Lu,
S. C. Wang,
ShengFu Hsu,
Y. J. Cheng,
YiaChung Chang
Publication year - 2008
Publication title -
optics express
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.394
H-Index - 271
ISSN - 1094-4087
DOI - 10.1364/oe.16.008748
Subject(s) - nanopillar , optics , materials science , anti reflective coating , refractive index , rigorous coupled wave analysis , omnidirectional antenna , broadband , polarizer , wavelength , optoelectronics , transmittance , physics , nanostructure , diffraction grating , layer (electronics) , nanotechnology , telecommunications , birefringence , computer science , antenna (radio)
Disordered GaN nanopillars of three different heights: 300, 550, and 720 nm are fabricated, and demonstrate broad angular and spectral antireflective characteristics, up to an incident angle of 60? and for the wavelength range of lambda=300-1800 nm. An algorithm based on a rigorous coupled-wave analysis (RCWA) method is developed to investigate the correlations between the reflective characteristics and the structural properties of the nanopillars. The broadband and omnidirectional antireflection arises mainly from the refractive-index gradient provided by nanopillars. Calculations show excellent agreement with the measured reflectivities for both s- and p- polarizations.
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