Resolution scaling in STED microscopy | Zendy

Benjamin Harke | Zendy; Jan KellerFindeisen | Zendy; Chaitanya K. Ullal | Zendy; Volker Westphal | Zendy; Andreas Schönle | Zendy; Stefan W. Hell | Zendy

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Resolution scaling in STED microscopy

Author(s) -

Benjamin Harke,

Jan KellerFindeisen,

Chaitanya K. Ullal,

Volker Westphal,

Andreas Schönle,

Stefan W. Hell

Publication year - 2008

Publication title -

optics express

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 1.394

H-Index - 271

ISSN - 1094-4087

DOI - 10.1364/oe.16.004154

Subject(s) - sted microscopy , optics , brightness , microscopy , image resolution , resolution (logic) , stimulated emission , saturation (graph theory) , super resolution microscopy , scaling , root mean square , square root , point spread function , materials science , physics , scanning confocal electron microscopy , laser , mathematics , computer science , quantum mechanics , geometry , combinatorics , artificial intelligence

We undertake a comprehensive study of the inverse square root dependence of spatial resolution on the saturation factor in stimulated emission depletion (STED) microscopy and generalize it to account for various focal depletion patterns. We used an experimental platform featuring a high quality depletion pattern which results in operation close to the optimal optical performance. Its superior image brightness and uniform effective resolution <25 nm are evidenced by imaging both isolated and self-organized convectively assembled fluorescent beads. For relevant saturation values, the generalized square-root law is shown to predict the practical resolution with high accuracy.

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