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Study on readout durability of super-RENS disk
Author(s) -
Qian Liu,
Toshio Fukaya,
Sihai Cao,
Chuan Fei Guo,
Zhuwei Zhang,
Yanjun Guo,
Jingsong Wei,
Junji Tominaga
Publication year - 2008
Publication title -
optics express
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.394
H-Index - 271
ISSN - 1094-4087
DOI - 10.1364/oe.16.000213
Subject(s) - durability , optics , transmittance , materials science , bubble , dielectric , microscope , layer (electronics) , physics , optoelectronics , composite material , mechanics
Characteristics essential for the readout durability of a superresolution near-field structure (super-RENS) disk are studied experimentally by using a home-built optical measuring setup and atomic force microscope, based on a simplified PtOx super-RENS disk. The experimental results show that for a super-RENS disk with constant structure and materials, readout signals including transmittance and reflectance vary with changes in bubble shape and size, indicating that the readout durability of the disk has a strong dependence on bubble stability, which is closely related to the thickness of the cover layer, the recording power and readout power, and the mechanical properties of the dielectric layer. Based on our experimental results, the main direction for improving readout durability is also proposed.

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