Moiré profilometry using liquid crystals for projection and demodulation | Zendy

Jan A.N. Buytaert | Zendy; Joris Dirckx | Zendy

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Moiré profilometry using liquid crystals for projection and demodulation

Author(s) -

Jan A.N. Buytaert,

Joris Dirckx

Publication year - 2008

Publication title -

optics express

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 1.394

H-Index - 271

ISSN - 1094-4087

DOI - 10.1364/oe.16.000179

Subject(s) - optics , profilometer , demodulation , structured light 3d scanner , projection (relational algebra) , moiré pattern , phase (matter) , materials science , liquid crystal on silicon , pixel , spatial light modulator , liquid crystal display , spatial frequency , liquid crystal , computer science , physics , channel (broadcasting) , surface finish , telecommunications , scanner , algorithm , quantum mechanics , composite material

A projection moiré profilometer is presented in which both projection and optical demodulation are realized with liquid crystal light modulators. The computer generated grids, realized on thin film transistor matrices, allow phase-stepping and discrete grid averaging without the need for any mechanically moving component. Spatial line pitch and phase steps can thus be readily adjusted to suit the measurement precision and object geometry. The device is able to perform topographic measurements with a height resolution of 15 microm on every pixel of the recording device.

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