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Black-box model for the complete characterization of the spectral gain and noise in semiconductor optical amplifiers
Author(s) -
Cristiano M. Gallep,
A. A. Rieznik,
H.L. Fragnito,
Newton C. Frateschi,
Evandro Conforti
Publication year - 2006
Publication title -
optics express
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.394
H-Index - 271
ISSN - 1094-4087
DOI - 10.1364/oe.14.001626
Subject(s) - optical amplifier , optics , amplified spontaneous emission , noise (video) , semiconductor , characterization (materials science) , amplifier , noise reduction , noise figure , black box , optoelectronics , physics , materials science , computer science , laser , acoustics , cmos , artificial intelligence , image (mathematics)
A Black Box Model for the quick complete characterization of the optical gain and amplified spontaneous emission noise in Semiconductor Optical Amplifiers is presented and verified experimentally. This model provides good accuracy, even neglecting third order terms in the spectral gain shift, and can provide cost reduction in SOA characterization and design as well as provide simple algorithms for hybrid integration in-package control.

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