Determining the influential depth for surface reflectance of sediment by BRDF measurements
Author(s) -
H. Zhang,
Kenneth J. Voss,
R. Pamela Reid
Publication year - 2003
Publication title -
optics express
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.394
H-Index - 271
ISSN - 1094-4087
DOI - 10.1364/oe.11.002654
Subject(s) - bidirectional reflectance distribution function , optics , wavelength , reflectivity , materials science , diffuse reflection , albedo (alchemy) , single scattering albedo , geology , mineralogy , physics , art , performance art , art history
We measure the Bi-directional reflectance distribution function (BRDF) of ooid sand layers with three particle size distributions (0.5-1mm, 0.25-0.5mm and 0.125-0.25mm) and layer thicknesses on a reflecting mirror to determine the influential depth in the optical region at wavelengths of 658 nm (red), 570 nm (green) and 457 nm (blue). The hemispherical reflectance (albedo) was used as an indicator of BRDF changes between different layers. Measurements are carried out on both dry and water wetted grains. The results indicate that for both dry and wet and all size distributions, the influential depth is at most 2mm.
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