Coherent X-ray diffractive imaging: applications and limitations | Zendy

Stefano Marchesini | Zendy; Henry N. Chapman | Zendy; Stefan P. HauRiege | Zendy; Richard A. London | Zendy; A. Szöke | Zendy; Haifeng He | Zendy; Malcolm R. Howells | Zendy; H. A. Padmore | Zendy; R. Rosen | Zendy; John C. H. Spence | Zendy; Uwe Weierstall | Zendy

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Coherent X-ray diffractive imaging: applications and limitations

Author(s) -

Stefano Marchesini,

Henry N. Chapman,

Stefan P. HauRiege,

Richard A. London,

A. Szöke,

Haifeng He,

Malcolm R. Howells,

H. A. Padmore,

R. Rosen,

John C. H. Spence,

Uwe Weierstall

Publication year - 2003

Publication title -

optics express

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 1.394

H-Index - 271

ISSN - 1094-4087

DOI - 10.1364/oe.11.002344

Subject(s) - optics , diffraction , ptychography , lens (geology) , coherent diffraction imaging , image resolution , tomographic reconstruction , tomography , physics , resolution (logic) , computer science , phase retrieval , fourier transform , quantum mechanics , artificial intelligence

The inversion of a diffraction pattern offers aberration-free diffraction-limited 3D images without the resolution and depth-of-field limitations of lens-based tomographic systems, the only limitation being radiation damage. We review our experimental results, discuss the fundamental limits of this technique and future plans.

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