X-ray phase-contrast microscopy and microtomography | Zendy

S. C. Mayo | Zendy; Timothy J. Davis | Zendy; Timur E. Gureyev | Zendy; P. R. Miller | Zendy; David M. Paganin | Zendy; A. Pogany | Zendy; A. W. Stevenson | Zendy; S. Wilkins | Zendy

AI Assistant Blog Pricing

Home ZAIA Blog

Open Access

X-ray phase-contrast microscopy and microtomography

Author(s) -

S. C. Mayo,

Timothy J. Davis,

Timur E. Gureyev,

P. R. Miller,

David M. Paganin,

A. Pogany,

A. W. Stevenson,

S. Wilkins

Publication year - 2003

Publication title -

optics express

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 1.394

H-Index - 271

ISSN - 1094-4087

DOI - 10.1364/oe.11.002289

Subject(s) - optics , microscopy , phase contrast microscopy , phase contrast imaging , microscope , phase retrieval , materials science , tomography , phase (matter) , resolution (logic) , contrast (vision) , optical microscope , tomographic reconstruction , scanning electron microscope , physics , fourier transform , quantum mechanics , artificial intelligence , computer science

In-line phase contrast enables weakly absorbing specimens to be imaged successfully with x-rays, and greatly enhances the visibility of fine scale structure in more strongly absorbing specimens. This type of phase contrast requires a spatially coherent beam, a condition that can be met by a microfocus x-ray source. We have developed an x-ray microscope, based on such a source, which is capable of high resolution phase-contrast imaging and tomography. Phase retrieval enables quantitative information to be recovered from phase-contrast microscope images of homogeneous samples of known composition and density, and improves the quality of tomographic reconstructions.

The content you want is available to Zendy users.

Already have an account? Click here to sign in.

Having issues? You can contact us here

Accelerating Research