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Transverse effects in ultrabroadband multifrequency Raman generation
Author(s) -
K.S. Syed,
GS McDonald,
G.H.C. New
Publication year - 2000
Publication title -
journal of the optical society of america b
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.741
H-Index - 144
eISSN - 1520-8540
pISSN - 0740-3224
DOI - 10.1364/josab.17.001366
Subject(s) - raman spectroscopy , transverse plane , optics , physics , diffraction , beam (structure) , intensity (physics) , structural engineering , engineering
The theory of ultrabroadband multifrequency Raman generation is extended, for the first time, to allow for beam-propagation effects in one and two transverse dimensions. We show that a complex transverse structure develops even when diffraction is neglected. In the general case, we examine how the ultrabroadband multifrequency Raman generation process is affected by the intensity, phase quality, and width of the input beams, and by the length of the Raman medium. The evolution of power spectra, intensity profiles, and global characteristics of the multifrequency beams are investigated and explained. In the two-dimensional transverse case, bandwidths comparable to the optical carrier frequency, spanning the whole visible spectrum and beyond, are still achievable.

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