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Finite-element model for phase-change recording
Author(s) -
J.H. Brusche,
H. P. Urbach,
A. Śegal
Publication year - 2005
Publication title -
journal of the optical society of america a
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.803
H-Index - 158
eISSN - 1520-8532
pISSN - 1084-7529
DOI - 10.1364/josaa.22.000773
Subject(s) - finite element method , optics , grating , polarization (electrochemistry) , phase change , materials science , optical recording , stack (abstract data type) , scattering , thermal , groove (engineering) , phase (matter) , physics , computer science , chemistry , engineering physics , quantum mechanics , metallurgy , thermodynamics , programming language , meteorology
The finite-element method is applied to model phase-change recording in a grooved recording stack. A rigorous model for the scattering of a three-dimensional focused spot by a one-dimensional periodic grating is used to determine the absorbed light in a three-dimensional region inside the phase-change layer. The optical model is combined with a three-dimensional thermal model to compute the temperature distribution. Land and groove recording and polarization dependence are studied, and the model is applied to the Blu-ray Disc.

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