Accurate cross-sectional stress profiling of optical fibers
Author(s) -
Michael R. Hutsel,
Reeve Ingle,
Thomas K. Gaylord
Publication year - 2009
Publication title -
applied optics
Language(s) - English
Resource type - Journals
ISSN - 0003-6935
DOI - 10.1364/ao.48.004985
Subject(s) - materials science , optics , birefringence , optical fiber , laser , cross section (physics) , stress (linguistics) , physics , linguistics , quantum mechanics , philosophy
A novel technique for determining two-dimensional, cross-sectional stress distributions in optical fibers and fiber-based devices is presented. Use of the Brace-Köhler compensator technique and a polarization microscope for the measurement of retardation due to stress-induced birefringence is described, along with the tomographic reconstruction process for the determination of stress. Measurements are performed on Corning SMF-28 fiber in an unperturbed section, a section near a cleaved end-face, and a section exposed to CO2 laser radiation. Cross-sectional stress distributions are presented. Stress relaxation is quantified in the cleaved fiber and the fiber exposed to CO2 laser radiation.
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