Gain measurements of Fabry-Perot InP/InGaAsP lasers using an ultrahigh-resolution spectrometer | Zendy

Y. Barbarin | Zendy; E.A.J.M. Bente | Zendy; Germain Servanton | Zendy; L. Mussard | Zendy; Y.S. Oei | Zendy; R. Nötzel | Zendy; M.K. Smit | Zendy

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Gain measurements of Fabry-Perot InP/InGaAsP lasers using an ultrahigh-resolution spectrometer

Author(s) -

Y. Barbarin,

E.A.J.M. Bente,

Germain Servanton,

L. Mussard,

Y.S. Oei,

R. Nötzel,

M.K. Smit

Publication year - 2006

Publication title -

applied optics

Language(s) - English

Resource type - Journals

ISSN - 0003-6935

DOI - 10.1364/ao.45.009007

Subject(s) - optics , materials science , fabry–pérot interferometer , laser , semiconductor laser theory , optoelectronics , lasing threshold , wavelength , spectrometer , semiconductor , physics

Measurements of the optical gain in a semiconductor laser using a 20 MHz resolution optical spectrum analyzer are presented for what is believed to be the first time. The high resolution allows for accurate gain measurements close to the lasing threshold. This is demonstrated by gain measurements on a bulk InGaAsP 1.5 microm Fabry-Perot laser. Combined with direct measurement of transparency carrier density values, parameters were determined for characterizing the gain at a range of wavelengths and temperatures. The necessity of the use of a logarithmic gain model is shown.

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