Open AccessPolarimetric photoluminescence microscope for strain imaging on semiconductor devices
Author(s) -
Emmanuel Schaub,
Brahim Ahammou,
Jean-Pierre Landesman
Publication year - 2022
Publication title -
applied optics
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.668
H-Index - 197
eISSN - 2155-3165
pISSN - 1559-128X
DOI - 10.1364/ao.449825
Subject(s) - materials science , optics , semiconductor , photoluminescence , polarization (electrochemistry) , anisotropy , optoelectronics , microscopy , linear polarization , luminescence , microscope , laser , physics , chemistry
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