Method of error analysis for phase-measuring algorithms applied to photoelasticity | Zendy

Juan Antonio Quiroga | Zendy; Agustı́n González-Cano | Zendy

AI Assistant Blog Pricing

Home ZAIA Blog

Open Access

Method of error analysis for phase-measuring algorithms applied to photoelasticity

Author(s) -

Juan Antonio Quiroga,

Agustı́n González-Cano

Publication year - 1998

Publication title -

applied optics

Language(s) - English

Resource type - Journals

ISSN - 0003-6935

DOI - 10.1364/ao.37.004488

Subject(s) - photoelasticity , phase (matter) , algorithm , matrix (chemical analysis) , optics , error analysis , element (criminal law) , series (stratigraphy) , computer science , phase unwrapping , mathematics , physics , materials science , interferometry , mathematical analysis , paleontology , quantum mechanics , cauchy stress tensor , political science , law , composite material , biology

We present a method of error analysis that can be applied for phase-measuring algorithms applied to photoelasticity. We calculate the contributions to the measurement error of the different elements of a circular polariscope as perturbations of the Jones matrices associated with each element. The Jones matrix of the real polariscope can then be calculated as a sum of the nominal matrix and a series of contributions that depend on the errors associated with each element separately. We apply this method to the analysis of phase-measuring algorithms for the determination of isoclinics and isochromatics, including comparisons with real measurements.

The content you want is available to Zendy users.

Already have an account? Click here to sign in.

Having issues? You can contact us here

Accelerating Research