Open AccessPredict VLSI Circuit Reliability Risks Using Neural Network
Author(s) -
Wei-Ting Kary Chien,
Randy Kang,
Howking Sii,
Ming Li
Publication year - 2014
Publication title -
universal journal of engineering science
Language(s) - Uncategorized
Resource type - Journals
eISSN - 2331-6624
pISSN - 2331-6632
DOI - 10.13189/ujes.2014.020502
Subject(s) - reliability (semiconductor) , very large scale integration , artificial neural network , computer science , reliability engineering , artificial intelligence , embedded system , engineering , power (physics) , physics , quantum mechanics
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