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The Effect of the Magnetic Field to the Microstructure and Sensitivity of Cu/Ni Film
Author(s) -
Azmi Khusnani,
Moh. Toifur,
Guntur Maruto,
Yudhiakto Pramudya
Publication year - 2019
Publication title -
universal journal of electrical and electronic engineering
Language(s) - English
Resource type - Journals
eISSN - 2332-3299
pISSN - 2332-3280
DOI - 10.13189/ujeee.2019.061611
Subject(s) - microstructure , sensitivity (control systems) , magnetic field , materials science , metallurgy , engineering , physics , electronic engineering , quantum mechanics

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