Open AccessThe Reliability of Circuits in the Basis Anticonjunction with Constant Faults of Gates
Author(s) -
M. A. Alekhina,
O. Yu. Barsukova
Publication year - 2014
Publication title -
computer science and information technology
Language(s) - English
Resource type - Journals
eISSN - 2331-6071
pISSN - 2331-6063
DOI - 10.13189/csit.2014.020106
Subject(s) - computer science , constant (computer programming) , reliability (semiconductor) , basis (linear algebra) , electronic circuit , reliability engineering , electrical engineering , mathematics , programming language , power (physics) , physics , geometry , quantum mechanics , engineering
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