Study of Structural Properties of Annealed Cdo and Zno Thin Films | Zendy

K. K. Hurde | Zendy; A. B. Lad | Zendy

AI Assistant Blog Pricing

Home ZAIA Blog

Open Access

Study of Structural Properties of Annealed Cdo and Zno Thin Films

Author(s) -

K. K. Hurde,

A. B. Lad

Publication year - 2017

Publication title -

material science research india

Language(s) - English

Resource type - Journals

eISSN - 2394-0565

pISSN - 0973-3469

DOI - 10.13005/msri/140213

Subject(s) - materials science , thin film , annealing (glass) , semiconductor , diffraction , chemical engineering , optoelectronics , nanotechnology , composite material , optics , engineering , physics

The CdO and ZnO are ntype semiconductors are transparent conducting in nature, inexpensive, mechanically stable and highly resistance to oxidation. In the present work these films have been obtained from thermal annealing of chemically deposited CdS and ZnS thin films. The structural properties of chemically deposited CdS and ZnS thin films and thermally annealed CdO and ZnO thin films have been studied. From x-ray diffraction data it is observed that annealing of the thin films at a particular temperature enhance the structural properties. Article history Received: 02 September 2017 Accepted: 02 October 2017

The content you want is available to Zendy users.

Already have an account? Click here to sign in.

Having issues? You can contact us here

Accelerating Research