Evaluation of stresses in flame resistant materials
Author(s) -
K. Arun Vasantha Geethan,
São José
Publication year - 2010
Publication title -
material science research india
Language(s) - English
Resource type - Journals
eISSN - 2394-0565
pISSN - 0973-3469
DOI - 10.13005/msri/070122
Subject(s) - reliability (semiconductor) , electronic component , soldering , electronics , materials science , electronic packaging , electronic equipment , thermal expansion , thermal shock , electronic systems , accelerated life testing , electric shock , mechanical engineering , reliability engineering , forensic engineering , composite material , engineering , electrical engineering , electronic engineering , psychology , developmental psychology , power (physics) , maturity (psychological) , physics , quantum mechanics
Electronic assemblies utilize a wide variety of plastics and metals in the fabrication and manufacturing of their products. These materials can have significant differences in their thermal TCE, which may result in high strains and stresses in the lead wires, solder joints, and PTH if these factors are not understood or if they are ignored. Temperature changes will produce dimensional changes in almost all materials normally used in the assembly of electronic chassis and PCBs. Dimensional changes can occur due to power cycling where Material Science Research India Vol. 7(1), 179-186 (2010)
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