
Letter to the Editor—The Bayesian Approach to the Reliability-Confidence Relation for Exponential Failure
Author(s) -
Edward L. Pugh
Publication year - 1960
Publication title -
operations research
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 3.797
H-Index - 140
eISSN - 1526-5463
pISSN - 0030-364X
DOI - 10.1287/opre.8.5.721
Subject(s) - bayes' theorem , bayesian probability , relation (database) , reliability (semiconductor) , exponential function , computer science , exponential distribution , statistics , mathematics , econometrics , artificial intelligence , data mining , quantum mechanics , mathematical analysis , power (physics) , physics