
The Effect of Gamma Irradiation on the Structural Properties of Porous Silicon
Author(s) -
Ismail K. Abbas,
Laith Ahmed Najam,
Abd UlKahliq AuobSulaiman
Publication year - 2014
Publication title -
international journal of physics
Language(s) - English
Resource type - Journals
eISSN - 2333-4576
pISSN - 2333-4568
DOI - 10.12691/ijp-3-1-1
Subject(s) - irradiation , wafer , materials science , porous silicon , raman spectroscopy , silicon , etching (microfabrication) , porosity , analytical chemistry (journal) , surface finish , layer (electronics) , nanotechnology , composite material , optoelectronics , optics , chemistry , physics , chromatography , nuclear physics